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BK Precision
Application Notes - General
Data Sheets - Digital Storage Ocilloscopes - Models 2530 and 2532
Data Sheets - Digital Storage Ocilloscopes - Models 2534, 2540 and 2542

Fluke
Fluke 187/189 Fluke 187/189 True-rms Digital Multimeter Extended Specifications
Fluke 787 Calibrating Voltage Input Signal Conditioners Using the Fluke 787 ProcessMeter
Fluke 787 Field Checking Loop-Powered Isolators Using the Fluke 787 ProcessMeter

Fluke Networks
Thermal Imaging - Application Notes I
How to Certify or Re-certify Twisted-Pair Cabling for 10 Gb/s Ethernet
NetTool™ Series II Inline Network Tester
Residential Cabling Solutions Network SuperVision Solutions™ for voice-data-video networks
See how to prevent costly fiber problems – before they begin
Testing LC Fiber Optic Links
 
DSP-4000 DSP-4000 Series CableAnalyzer
DTX Series DTX CableAnalyzerTM Accessories Guide
EtherScope™ EtherScope™ Series II Wireless Network Assistant
Fluke 787 Field Checking Loop-Powered Isolators Using the Fluke 787 ProcessMeter
MT-RJ Testing MT-RJ Fiber Optic Links
VF-45 Testing VF-45 Fiber Optic Links
TS40 TS®40 Series Test Sets: Datasheet and Literature
TS90 TS®90 and TS®100 Cable Fault Finders

Data Acquisition/ Switch Units
Practical Temperature Measurements Application Note 290
A Comparison of Leading Switch/Measure Solutions
Test System Signal Switching: Application Note
34970A Making High-Accuracy Temperature Measurements With the 34970A Data Acquisition Switch Unit
34970A Programming 34970A's for high channel count and high throughput with Visual Basic
34980A 34980A Multifunction Switch/Measure Unit in Systems (8-slot mainframe)
34980A Designing an RF switch system using the 34980A
34980A How to Verify the Functionality of Your 34980A Switch Modules
34980A A Comparison Between PXI and the Agilent 34980A for Switch/Measure Applications
34980A / 3499A/B/C The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
 
Digital Multimeters
8-Hints for Making Better Multimeter Measurements
9 Tips for Making Better Resistance Measurements
Cathodic Protection of Steel in Concrete Using LXI
Make Better RMS Measurements with Your DMM
Making Better Measurements with your Digital Multimeter
Practical Temperature Measurements Application Note 290
Understanding Reading Accuracy and Resolution in a 61/2-Digit DMM
Using LXI to Boost Throughput in Semiconductor Manufacturing
34401 / 34405A Migration from the Agilent 34401A to the Agilent 34405A Digital Multimeter
34401 / 34410A / 34411A Replacing the Agilent 34401A in Your Test System with the New Agilent 34410A and 34411A High-Performance Digital Multimeters
34401A / 3499A/B/C How to Program the 3499A/B/C Switch and the 34401A Digital Multimeter for Scanning Measurements
34401A / 3499A/B/C Making High Accuracy Temperature Measurements with the 3499A/B/C Switch and the 34401A Digital Multimeter
34410A / 34411A Agilent 34410A/34411A 61/2 Digit High-Performance Multimeters
3458A Making AC Voltage measurements to 10ppm accuracy with the Agilent 3458A
 
Frequency Counters
4 More Hints for Making Better Frequency Counter Measurements
8 Hints for Making Better RF Counter Measurements
Tips for making more accurate measurements with a frequency counter
Understanding Frequency Counter Specifications
More Hints for Making Better Frequency Counter Measurements
 
Modules
A Comparison Between PXI and the Agilent 34980A for Switch/Measure Applications
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
The Agilent N6700 Modular Power System: Determining Specifications when Paralleling Outputs
Innovative Power Supplies Save Rack Space
Testing LCD Backlight Inverters using the Agilent N6700 Modular Power System (MPS)
 
34980A Multifunction Switch/Measure System Modules
34980A Multifunction Switch/Measure Unit in Systems (8-slot mainframe)
 
Oscilloscopes
Debugging a PCI Bus with a Mixed-Signal Oscilloscope
Debugging Embedded Mixed-Signal Designs Using Mixed Signal Oscilloscopes
Deep-Memory Fast Response Oscilloscopes: The New Tools of Choice
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements
 
Agilent 6000 Series: Performance Guide Using 89600 Vector Signal Analyzer Software
Agilent 7000 Series:
Evaluating Oscilloscopes for Best Signal Visibility
Quick Facts
 
Power Supplies
15 Determinants in DC Power Supply Selection
10 Practical Tips You Need to Know About Your Power Products
Agilent Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
Bench Power Supply Tutorial
Choosing the Right DC System Power Supply
Increase Automotive ECU Test Throughput
Increase DC-input Battery Adapter Test Throughput By Several-fold
Innovative Power Supplies Save Rack Space
Optimizing Power Product Usage to Speed Design Validation Testing
Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test
Specifying and Buying a Bench Power Supply
Understanding Linear Power Supply Operation
Using LXI to Boost Throughput in Semiconductor Manufacturing
Visual Basic with LAN sockets for test instruments
VXI Systems Help Test Crystal Oscillators
 
E8285A Converting 8924C software for the E8285A CDMA Mobile Station Test Set
N6700 How to use the Agilent N6700 Series Modular Power System to replace an Agilent 662xA
N6700 Testing LCD Backlight Inverters using the Agilent N6700 Modular Power System (MPS)
N6700 The Agilent N6700 Modular Power System: Determining Specifications when Paralleling Outputs
 
Waveform Generators
8 Hints for Getting More from Your Function Generator
Better, Safer Power Generation Measurements in Less Time
Correlating Software and Analog Outputs In a CAN Controller
Create a Variety of Frequency Sweeps, Including Stepped Sweep Using Frequency Modulation
Create Music using Frequency Modulation
Creating Arbitrary Waveforms Using Direct Digital Synthesis (DDS)
Direct instrument connection using LAN
How to Generate Low Duty-Cycle Pulses with a Function Generator
How to Capture, save, and reproduce arbitrary load current waveforms
How to Connect Two or More Signal Generators to Create a Multi-Channel Waveform Generator
HP3324A Product Note: A multi-channel setup with programmable inter-channel phase
Using a Function/Arbitrary Waveform Generator to Generate Pulses
 
Other
Basics of Measuring the Dielectric Properties of Materials
Effective Multi-tap Transformer Measurement using a Scanner and the Agilent 4263B LCR Meter
Effective Transformer/LF Coil Testing
Fundamentals of the Electronic Counters
Fundamentals of Time Interval Measurements
Impedance Measurement Handbook
I/O Libraries Supported Interfaces
Modern Connectivity– Using USB and LAN I/O Converters
Simplified PC Connections for GPIB Instruments
Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
System Developer Guide: Using USB in the Test and Measurement Environment
Test-System Development Guide Computer I/O Considerations
Test-System Development Guide: Understanding Drivers and Direct I/O
 
34980A 34980A Multifunction Switch/Measure Unit in Systems (8-slot mainframe)
3499A/B/C, 34980A The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
34405A Easy Steps to Integrate the 34405A Multimeter into a System
34405A Side-by-Side Comparison: Agilent 34405A and Fluke 45 Digital Multimeter
34401A / 34405A Migration from the Agilent 34401A to the Agilent 34405A Digital Multimeter
4263B Effective Multi-tap Transformer Measurement using a Scanner and the Agilent 4263B LCR Meter
AN 1305-4 Agilent AN 1305-4 Effective Electrolytic Capacitors Testing Application Note
E4980A Improving Test Efficiency of MEMS Electrostatic Actuators Using the Agilent E4980A Precision LCR Meter
E4980A Characterizing Electromagnetic MEMS Optical Scanners Using the Agilent E4980A Precision LCR Meter
E4980A Characterizing Electromagnetic MEMS Optical Switch Actuators Using the Agilent E4980A Precision LCR Meter

Tektronix
Arbitrary/Function Generator Offers Versatile and Convenient Solutions for AM/FM Radio Test and Alignment
Automated Limit Testing
Characterization of IQ Modulators Counts On Flexible Signal Generator Stimulus
Debugging a mixed-signal embedded design with the Tektronix MSO4000 Series Mixed Signal Oscilloscope
Debugging Low-Speed Serial Buses in Embedded System Design
Debug Power Factor Correction Circuits with A Digital Phosphor Oscilloscope
Digital Design Debugging Guide
Introduction to Mixed Signal Test Solutions
Oscilloscope selection made easy
Pocket Guide to Digital Storage Oscilloscopes
Replicating Real World Signals with an Arbitrary/Function Generator
See a World Others Don’t -The Story Behind DPO
TekVPI™Technology Delivers Versatility and Ease-of-Use in a New Probe Interface Architecture
Test and Measurement Fundamentals: A Quick Guide to Oscilloscopes and Probes
Wave Inspector® Simplifying Waveform Analysis
 
DPO4000 Troubleshooting Your Design with the DPO4000 Series Oscilloscopes
TPS2000 TPS2000 Series Troubleshooting Tips
TDS3000 Digital Phosphor for Mainstream Electronics: Introducing the TDS3000 Family of DPO Oscilloscopes
TDS3000B TDS3000B DPO Solves Todays Power Measurement Problems