Tektronix Tektronix

Tektronix Probe Current 200 MHz XFMR

  • Techni-Tool Part #: 767TE200
  • Mfg Part #: CT2
  • Sold per: EACH
  • Estimated weight: .26 lb
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  • The Current Probes are designed for permanent or semi-permanent in-circuit installation. Each probe consists of a current transformer and an interconnecting cable. The current transformers have a small hole through which a current carrying conductor is passed during circuit assembly.

    The P6041 Probe Cable provides the connection between the CT2 Current Transformers and a BNC oscilloscope input. A 50 Ω termination is required to terminate the cable when connected to a high impedance (1 MΩ) oscilloscope input. One probe cable can be used to monitor several current transformers that have been wired into a circuit.

    Miniature Construction
    The detachable cable design enables one or more probes to be located on circuit boards or in other limited space areas.

    Extendible Probe Length
    Specified rise time and bandwidth are obtained when using the probe cables provided: The P6041 cable use with the CT2 is 42 inches nominal. If additional length is required, the cables can be extended by using high quality 50 Ω cable and suitable interface connectors. Long cables may degrade high frequency response.

    High Sensitivity
    The CT2 provides 1 mV per milliamp when terminated in 50 Ω.

    Typical Systems:
    The CT2 are dynamic (i.e., non-DC) current measuring devices. They are typically used in conjunction with compatible high bandwidth oscilloscopes and other instruments to observe and/or record high frequency current waveforms. The CT2 normally operate directly into 50 Ω scopes and other measuring device inputs.

    The CT2 can be used with 1 MΩ input systems; use the P6041 probe cable and terminate the output with a 50 Ω feed-through termination.

    In all cases, the CT2 must work into 50 Ωs to obtain specified performance and sensitivity.

    Typical Measurement Applications:

    Differential Current Measurements

    Most true-differential voltage amplifiers have a maximum bandwidth of about 100 MHz. The CT2 can make differential current measurements to 200 MHz, by passing two wires carrying opposing currents through the same core. The displayed result is the difference current.

    Single-shot and Low Rep-rate Pulse Measurements
    These common measurements are easy to make with the CT2 provided that your signal fits within the Max Pulse Current and Amp-second Product (Current-time Product) guidelines for the specific current probe characteristics.

    For example, the CT2 is rated at 36 Amps peak, with an Amp-Second Product of 50 x 10-6 Seconds (50 Amp-microseconds), therefore the CT2 can safely handle a 36 Amp peak pulse with a maximum width of 1.39 microseconds or lower amplitude pulses for longer pulse widths. The CT2 has low frequency rolloff characteristics. Low frequency "droop" will exhibit itself when the pulse width approaches the L/R time constant of the specific transformer.

    Propagation Delay Measurements
    Two CT2 Current Transformers with matching probe cables can be used to measure propagation delay (transit time) between the input and output currents of high frequency devices. The probe outputs are connected to the inputs of dual channel real-time or sampling scopes.

    Verification of any Probe/Cable/Scope System mismatch can be obtained by passing the same signal current through both probes and observing total system delay difference, if any.

    See "Technical Details" tab for more info.


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  • Features & Benefits:
    • High Bandwidth
    • Ultra-low Inductance
    • Very Small Form Factor
    • Characterize Current Waveforms up to <200 pSec Rise Times
    • Very Low Loading of Circuit Under Test
    • Fits Into Dense, Closely-spaced Circuit Designs

    Applications:
    • Data Storage Read Channel Design
    • Silicon Characterization
    • High-frequency Analog Design
    • ESD Testing
    • Signal Injection
    • Differential Current Measurements
    • Single Shot Low Rep-rate Pulse Measurements
    • Propagation Delay Measurement
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